M. Jaenada Malagón, L. Pardo Llorente, N. Balakrishnan
One-shot devices analysis involves an extreme case of interval censoring. Some kind of one-shot devices do not get destroyed when tested, and so can continue within the experiment providing extra information. Further, lifetime distributions can be estimated via accelerated life tests (ALTs) by running the tests at varying stress levels. Step-stress tests increase the stress levels at pre-fixed times gradually during the life-testing experiment. The cumulative exposure model is assumed for such models, relating the lifetime distribution of units at different stress levels.
We develop robust estimators and Wald-type test statistics based on the density power divergence (DPD) for non-destructive one-shot devices under the step-stress ALTs with Weibull lifetime distributions. Moreover, we examine theoretically and empirically the robustness properties of the estimators and test statistics, as well as prediction accuracy of different lifetime characteristics.
Palabras clave: Density power divergence, one-shot devices, robustness
Programado
GT04 Análisis Multivariante y Clasificación III
7 de junio de 2022 16:50
Sala de Claustros
